Lazy TRIM: Optimizing the journaling overhead caused by TRIM commands on Ext4 file system

Kitae Lee, Dong Hyun Kang, Daeho Jeong, Young Ik Eom

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Nowadays, NAND flash storage devices have become a standard for secondary storage in consumer electronics devices. Unfortunately, TRIM command for the flash storage causes journaling overhead on the ext4 file system. In this paper, to figure out the root cause of the overhead, we study the relationship between ordered mode journaling and the TRIM command. Then, we propose a novel scheme, called lazy TRIM, that adopts multi-threading in background to gracefully distribute the journaling overhead caused by the TRIM command. Our evaluation results clearly confirm that lazy TRIM improves the latency of the fsync system call by up to 99% compared with the conventional scheme.

Original languageEnglish
Title of host publication2018 IEEE International Conference on Consumer Electronics, ICCE 2018
EditorsSaraju P. Mohanty, Peter Corcoran, Hai Li, Anirban Sengupta, Jong-Hyouk Lee
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
ISBN (Electronic)9781538630259
DOIs
StatePublished - 26 Mar 2018
Event2018 IEEE International Conference on Consumer Electronics, ICCE 2018 - Las Vegas, United States
Duration: 12 Jan 201814 Jan 2018

Publication series

Name2018 IEEE International Conference on Consumer Electronics, ICCE 2018
Volume2018-January

Conference

Conference2018 IEEE International Conference on Consumer Electronics, ICCE 2018
Country/TerritoryUnited States
CityLas Vegas
Period12/01/1814/01/18

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