Long-term study of simulator sickness: Differences in EEG response due to individual sensitivity

Jong Rack Park, Dae Woon Lim, Soo Yeol Lee, Hang Woon Lee, Mi Hyun Choi, Soo Cheol Chung

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

This study identifies differences in the electroencephalogram (EEG) responses caused by individual sensitivity to simulator sickness. Simulator sickness was investigated by studying the changes in simulator sickness in two different subject groups (sick group and nonsick group). Subjective evaluations using the simulator sickness questionnaire and the EEG response data were gathered every 5 min while the subjects were driving at 60 km/h for 60 min in the driving graphic simulator. The response to every item of the subjective evaluation increased linearly with time; the response level in the sick group was higher than in the nonsick group. The EEG analysis showed that the sick and nonsick groups were statistically significantly different with respect to the parameter θ/total at frontal lobe and parietal lobe.

Original languageEnglish
Pages (from-to)857-865
Number of pages9
JournalInternational Journal of Neuroscience
Volume118
Issue number6
DOIs
StatePublished - Jun 2008

Keywords

  • EEG
  • Sick and nonsick group
  • Simulator sickness

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