Low-noise Image Sensors with Shifted Pseudo-correlated Multiple Sampling Method

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Abstract

This paper presents a low-noise image sensor with a shifted pseudo-correlated multiple sampling (S-PMS) method based on a conventional single-slope analog-to-digital converter (SS-ADC) structure. By shifting the reference voltage of the ramp signal, a single ramp generator acts as a dual ramp generator, leading to reduced area and power consumption. In addition, by dividing the two illumination regions and performing PMS, the analog-to-digital conversion time can be reduced by half, resulting in an increase in frame rates. A prototype SS-ADC with S-PMS for a low-noise image sensor was fabricated using a 28 nm process. The results showed that the proposed S-PMS increased by 49% of frames per second and reduced random noise by 53%.

Original languageEnglish
Title of host publicationISCAS 2024 - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350330991
DOIs
StatePublished - 2024
Event2024 IEEE International Symposium on Circuits and Systems, ISCAS 2024 - Singapore, Singapore
Duration: 19 May 202422 May 2024

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2024 IEEE International Symposium on Circuits and Systems, ISCAS 2024
Country/TerritorySingapore
CitySingapore
Period19/05/2422/05/24

Keywords

  • CMOS Image sensor
  • Pseudo Multiple Sampling (PMS)
  • Random Noise

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