Abstract
The authors report on the dielectric and leakage current properties of room temperature grown MgO- Ba0.6 Sr0.4 Ti O3 (MgO-BST) composite thin films to be utilized InGaZn O4 thin films transistors (TFTs) fabricated on a polyethylene terephthalate (PET) substrate. The InGaZn O4 TFTs with MgO-BST gate dielectrics exhibited low operation voltage of 4 V, high on/off current ratio of 4.13× 106, and high field effect mobility of 10.86 cm2 V s. These results verify that a room temperature grown MgO-BST gate dielectric is a good candidate for producing high performance InGaZn O4 TFTs on plastic substrates.
| Original language | English |
|---|---|
| Article number | 032901 |
| Journal | Applied Physics Letters |
| Volume | 93 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2008 |