Abstract
CaTiO 3 :Pr 3+ films were deposited on different substrates such as Al 2 O 3 (0 0 0 1), Si (1 0 0), MgO (1 0 0), and fused silica using pulsed laser deposition method. The crystallinity and surface morphology of these films were investigated by XRD and SEM measurements. The films grown on the different substrates have different crystallinity and morphology. The FWHM of (2 0 0) peak are 0.18, 0.25, 0.28, and 0.30 for Al 2 O 3 (0 0 0 1), Si (1 0 0), MgO (1 0 0), and fused silica, respectively. The grain sizes of phosphors grown on different substrates were estimated by using Scherrer's formula and the maximum crystallite size observed for the thin film grown on Al 2 O 3 (0 0 0 1). The room temperature PL spectra exhibit only the red emission peak at 613 nm radiated from the transition of ( 1 D 2 → 3 H 4 ) and the maximum PL intensity for the films grown on the Al 2 O 3 (0 0 0 1) is 1.1, 1.4, and 3.7 times higher than that of the CaTiO 3 :Pr 3+ films grown on MgO (1 0 0), Si (1 0 0), and fused Sillica substrates, respectively. The crystallinity, surface morphology and luminescence spectra of thin-film phosphors were highly dependent on substrates.
Original language | English |
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Pages (from-to) | 5062-5066 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 255 |
Issue number | 9 |
DOIs | |
State | Published - 15 Feb 2009 |
Keywords
- Oxides
- Phosphors
- Substrate
- X-ray diffraction