Abstract
Mn+-implanted and annealed Si1-xGex thin films grown on p-Si (100) substrates were formed with the goal of producing (Si1-xGex)1-yMny with a high ferromagnetic transition temperature (Tc). The double-crystal X-ray rocking curves and transmission electron microscopy images showed that the Mn-implanted and annealed Si1-xGex thin films were single crystalline. The magnetization curves as functions of the magnetic field clearly showed that ferromagnetism existed in the Mn+-implanted and annealed Si1-xGex thin films, and the magnetization curves as functions of the temperature showed that the Tc value was above 300 K. These results indicate that the formed (Si1-xGex)1-yMny thin films hold promise for potential applications in Si-based spintronic devices operating at room temperature.
Original language | English |
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Pages (from-to) | 161-164 |
Number of pages | 4 |
Journal | Solid State Communications |
Volume | 147 |
Issue number | 5-6 |
DOIs | |
State | Published - Aug 2008 |
Keywords
- A. Semiconductor
- C. Impurities in semiconductors