Magnetic properties of Mn+-implanted and annealed Si1-xGex thin films grown on p-Si (100) substrates

  • Y. H. Kwon
  • , T. W. Kang
  • , Y. Shon
  • , H. Y. Cho
  • , H. C. Jeon
  • , Y. S. Park
  • , D. U. Lee
  • , T. W. Kim
  • , D. J. Fu
  • , X. J. Fan

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Mn+-implanted and annealed Si1-xGex thin films grown on p-Si (100) substrates were formed with the goal of producing (Si1-xGex)1-yMny with a high ferromagnetic transition temperature (Tc). The double-crystal X-ray rocking curves and transmission electron microscopy images showed that the Mn-implanted and annealed Si1-xGex thin films were single crystalline. The magnetization curves as functions of the magnetic field clearly showed that ferromagnetism existed in the Mn+-implanted and annealed Si1-xGex thin films, and the magnetization curves as functions of the temperature showed that the Tc value was above 300 K. These results indicate that the formed (Si1-xGex)1-yMny thin films hold promise for potential applications in Si-based spintronic devices operating at room temperature.

Original languageEnglish
Pages (from-to)161-164
Number of pages4
JournalSolid State Communications
Volume147
Issue number5-6
DOIs
StatePublished - Aug 2008

Keywords

  • A. Semiconductor
  • C. Impurities in semiconductors

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