Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

D. Soundararajan; D. Mangalaraj; D. Nataraj; L. Dorosinskii; J. Santoyo-Salazar; H. C. Jeon; T. W. Kang

doi:10.1016/j.apsusc.2009.04.012

Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

D. Soundararajan, D. Mangalaraj, D. Nataraj, L. Dorosinskii, J. Santoyo-Salazar, H. C. Jeon, T. W. Kang

Quantum-Functional Semiconductor Research Center

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.

Original language	English
Pages (from-to)	7517-7523
Number of pages	7
Journal	Applied Surface Science
Volume	255
Issue number	17
DOIs	https://doi.org/10.1016/j.apsusc.2009.04.012
State	Published - 15 Jun 2009

Keywords

Dilute magnetic semiconductors
M-H curve
Magnetic domains
ZnTe:Cr film

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title = "Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method",

abstract = "ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.",

keywords = "Dilute magnetic semiconductors, M-H curve, Magnetic domains, ZnTe:Cr film",

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T1 - Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

AU - Soundararajan, D.

AU - Mangalaraj, D.

AU - Nataraj, D.

AU - Dorosinskii, L.

AU - Santoyo-Salazar, J.

AU - Jeon, H. C.

AU - Kang, T. W.

PY - 2009/6/15

Y1 - 2009/6/15

N2 - ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.

AB - ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.

KW - Dilute magnetic semiconductors

KW - M-H curve

KW - Magnetic domains

KW - ZnTe:Cr film

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SP - 7517

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JO - Applied Surface Science

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Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

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