MAST: Multi-level associated sector translation for NAND flash memory-based storage system

Jeehong Kim, Dong Hyun Kang, Byungmin Ha, Hyunjin Cho, Young Ik Eom

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

NAND flash memories have been widely adopted as storage on computing devices, since it has strong effectiveness on performance. However, asymmetric operation performance of NAND flash memories still impedes high performance. To mitigate this performance hurdle, most storage devices of NAND flash memories have used Flash Translation Layer (FTL). In this paper, we propose a novel workload-aware FTL mapping policy, called Multi-level Associated Sector Translation (MAST). MAST divides log block depending on characteristics of data, and dynamically detects hot pages to avoid unnecessary merge operations of FTL. In experimental results, we show that our approach outperforms FAST method by 10% and LAST by 3%, respectively.

Original languageEnglish
Title of host publicationComputer Science and Its Applications - Ubiquitous Information Technologies
EditorsHwa Young Jeong, Ivan Stojmenovic, James J. Park, Gangman Yi
PublisherSpringer Verlag
Pages817-822
Number of pages6
ISBN (Electronic)9783662454015
DOIs
StatePublished - 2015
Event6th FTRA International Conference on Computer Science and its Applications, CSA 2014 - Guam, United States
Duration: 17 Dec 201419 Dec 2014

Publication series

NameLecture Notes in Electrical Engineering
Volume330
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

Conference6th FTRA International Conference on Computer Science and its Applications, CSA 2014
Country/TerritoryUnited States
CityGuam
Period17/12/1419/12/14

Keywords

  • Address translation
  • Associative mapping
  • Flash translation layer
  • NAND flash memory

Fingerprint

Dive into the research topics of 'MAST: Multi-level associated sector translation for NAND flash memory-based storage system'. Together they form a unique fingerprint.

Cite this