Microcalcification detection system in digital mammogram using two-layer SVM

Sunil Cho, Sung Ho Jin, Ju Won Kwon, Yong Man Ro, Sung Min Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Microcalcification detection in a mammogram is an effective method to find the early stage of breast tumor. Especially, computer aided diagnosis (CAD) improves the working performance of radiologists and doctors as it offers an efficient microcalcification detection. In this paper, we propose a microcalcification detection system which consists of three modules; coarse detection, clustering, and fine detection module. The coarse detection module finds candidate pixels from an entire mammogram which are suspected as a part of a microcalcification. The module not only extracts two median contrast features and two contrast-to-noise ratio features, but also categorizes the candidate pixels with a linear kernel-based SVM classifier. Then, the clustering module forms the candidate pixels into regions of interest (ROI) using a region growing algorithm. The objective of the fine detection module is to decide whether the corresponding region classifies as a microcalcification or not. Eleven features including distribution, variance, gradient, and various edge components are extracted from the clustered ROIs and are fed into a radial basis function-based SVM classifier to determine the microcalcification. In order to verify the effectiveness of the proposed microcalcification detection system, the experiments are performed with full-field digital mammogram (FFDM). We also compare its detection performance with an ANN-based detection system.

Original languageEnglish
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging -Image Processing
Subtitle of host publicationAlgorithms and Systems VI
DOIs
StatePublished - 2008
EventImage Processing: Algorithms and Systems VI - San Jose, CA, United States
Duration: 28 Jan 200829 Jan 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6812
ISSN (Print)0277-786X

Conference

ConferenceImage Processing: Algorithms and Systems VI
Country/TerritoryUnited States
CitySan Jose, CA
Period28/01/0829/01/08

Keywords

  • CAD (Computer Aided Diagnosis)
  • Microcalcification
  • SVM (Support Vector Machine)

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