Abstract
Deep-level transient spectroscopy (DLTS) was used to characterize native defects of Ga1-xMnx layers with x≈2.2% and x≈4.4% grown by molecular beam epitaxy (MBE). Three hole traps at about 0.38±0.01, 0.43±0.01, and 0.65±0.01 eV above the valence band maxima were observed. These traps were found to be associated with the gallium vacancy or the arsenic antisite complex, and single- and double-donor states of arsenic antisite.
| Original language | English |
|---|---|
| Pages (from-to) | 4354-4356 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 83 |
| Issue number | 21 |
| DOIs | |
| State | Published - 24 Nov 2003 |
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