NTIRE 2020 challenge on image demoireing: Methods and results

Shanxin Yuan, Radu Timofte, Ales Leonardis, Gregory Slabaugh, Xiaotong Luo, Jiangtao Zhang, Yanyun Qu, Ming Hong, Yuan Xie, Cuihua Li, Dejia Xu, Yihao Chu, Qingyan Sun, Shuai Liu, Ziyao Zong, Nan Nan, Chenghua Li, Sangmin Kim, Hyungjoon Nam, Jisu KimJechang Jeong, Manri Cheon, Sung Jun Yoon, Byungyeon Kang, Junwoo Lee, Bolun Zheng, Xiaohong Liu, Linhui Dai, Jun Chen, Xi Cheng, Zhenyong Fu, Jian Yang, Chul Lee, An Gia Vien, Hyunkook Park, Sabari Nathan, M. Parisa Beham, S. Mohamed Mansoor Roomi, Florian Lemarchand, Maxime Pelcat, Erwan Nogues, Densen Puthussery, P. S. Hrishikesh, C. V. Jiji, Ashish Sinha, Xuan Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

33 Scopus citations

Abstract

This paper reviews the Challenge on Image Demoireing that was part of the New Trends in Image Restoration and Enhancement (NTIRE) workshop, held in conjunction with CVPR 2020. Demoireing is a difficult task of removing moire patterns from an image to reveal an underlying clean image. The challenge was divided into two tracks. Track 1 targeted the single image demoireing problem, which seeks to remove moire patterns from a single image. Track 2 focused on the burst demoireing problem, where a set of degraded moire images of the same scene were provided as input, with the goal of producing a single demoired image as output. The methods were ranked in terms of their fidelity, measured using the peak signal-to-noise ratio (PSNR) between the ground truth clean images and the restored images produced by the participants' methods. The tracks had 142 and 99 registered participants, respectively, with a total of 14 and 6 submissions in the final testing stage. The entries span the current state-of-the-art in image and burst image demoireing problems.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
PublisherIEEE Computer Society
Pages1882-1893
Number of pages12
ISBN (Electronic)9781728193601
DOIs
StatePublished - Jun 2020
Event2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States
Duration: 14 Jun 202019 Jun 2020

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2020-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
Country/TerritoryUnited States
CityVirtual, Online
Period14/06/2019/06/20

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