Optical properties in Mn-doped ZnS thin films: Photoluminescence quenching

  • A. I. Inamdar
  • , Sangeun Cho
  • , Yongcheol Jo
  • , Jongmin Kim
  • , Jaeseok Han
  • , S. M. Pawar
  • , Hyeonseok Woo
  • , R. S. Kalubarme
  • , Chan Jin Park
  • , Hyungsang Kim
  • , Hyunsik Im

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

Mn-doped ZnS thin films are synthesized on soda-lime glass substrates using magnetron co-sputtering technique. X-ray diffraction and atomic force microscopy measurements indicate that of the as-obtained films including the highest Mn (~11% relative to the Zn concentration) in the lattice of ZnS are amorphous with a granular morphology. X-ray photoelectron spectroscopy reveals the presence of Zn2+, Mn2+ and S2- chemical states in the films. The undoped ZnS film exhibits photoluminescence (PL) peaks at energies around 3.26 eV (wavelength ~379 nm) and 2.95 eV (~420 nm), which originate from the interplay between excited electron, defect (sulfur vacancy) states and the valence band. For the Mn-doped ZnS films, the band-to-band emission peak is quenched and shifts toward to higher energies at a rate of 11.7±2 meV/Mn%. We propose that Mn dopant-mediated structural phases and non-radiative deep traps in ZnS cause the modification in the optical transition.

Original languageEnglish
Pages (from-to)126-129
Number of pages4
JournalMaterials Letters
Volume163
DOIs
StatePublished - 15 Jan 2016

Keywords

  • Defects
  • Mn-doped Zinc sulfide
  • Photoluminescence

Fingerprint

Dive into the research topics of 'Optical properties in Mn-doped ZnS thin films: Photoluminescence quenching'. Together they form a unique fingerprint.

Cite this