Oxygen- and photoresist-related interface states of 4H-SiC Schottky diode observed by deep-level transient spectroscopy
- Hong Jeon Kang
- , Jeong Hyun Moon
- , Wook Bahng
- , Suhyeong Lee
- , Hyunwoo Kim
- , Sang Mo Koo
- , Dohyun Lee
- , Dongwha Lee
- , Hoon Young Cho
- , Jaeyeong Heo
- , Hyeong Joon Kim
Research output: Contribution to journal › Article › peer-review
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Scopus
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