Patent analysis for technology forecasting: Sector-specific applications

Byungun Yoon, Sungjoo Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

23 Scopus citations

Abstract

Although patent analysis is a powerful technique to forecast the future of technology, it is not obvious whether the analysis is applicable to technology forecasting over all industries. Since the strategies of firms to protect their innovation vary among patents and trade secrets according to the characteristics of industries, patent analysis might be inappropriate to some industries. Therefore, this paper aims at improving the usefulness of patent analysis in TF by identifying relevant industries which the patent-based TF can be used in. To this end, first, sectoral differences in patenting activities will be investigated, presenting implications from patent activities, innovation patterns and patent statistics. Second, the applicability of patent trend analysis for technology forecasting will be explored in each industry by applying S-curve fitting with patent data. Finally, the method to improve the performance of patent-based TF will be suggested. The comparison of patent application status will make technology forecasting accurate, considering a time lag between R & D investment and patent application of the technology. This process will provide a good vehicle for precise TF by clarifying the application of patent analysis.

Original languageEnglish
Title of host publicationIEMC-Europe 2008 - 2008 IEEE International Engineering Management Conference, Europe
Subtitle of host publicationManaging Engineering, Technology and Innovation for Growth
DOIs
StatePublished - 2008
EventIEMC-Europe 2008 - 2008 IEEE International Engineering Management Conference, Europe: Managing Engineering, Technology and Innovation for Growth - Estori, Portugal
Duration: 28 Jun 200830 Jun 2008

Publication series

NameIEMC-Europe 2008 - 2008 IEEE International Engineering Management Conference, Europe: Managing Engineering, Technology and Innovation for Growth

Conference

ConferenceIEMC-Europe 2008 - 2008 IEEE International Engineering Management Conference, Europe: Managing Engineering, Technology and Innovation for Growth
Country/TerritoryPortugal
CityEstori
Period28/06/0830/06/08

Keywords

  • Patent analysis
  • S-curve
  • Sectoral patterns of innovation
  • Technology forecasting

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