Photo-Electron Emission Microscopy of Semiconductor Surfaces

R. J. Nemanich; S. L. English; J. D. Hartman; W. Yang; H. Ade; R. F. Davis

doi:10.1017/S1431927600023151

Photo-Electron Emission Microscopy of Semiconductor Surfaces

R. J. Nemanich, S. L. English, J. D. Hartman, W. Yang, H. Ade, R. F. Davis

Department of Physics

North Carolina State University

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	606-607
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	4
DOIs	https://doi.org/10.1017/S1431927600023151
State	Published - 1 Jul 1998

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@article{d98441127472412ea0184358e23591dc,

title = "Photo-Electron Emission Microscopy of Semiconductor Surfaces",

author = "Nemanich, {R. J.} and English, {S. L.} and Hartman, {J. D.} and W. Yang and H. Ade and Davis, {R. F.}",

year = "1998",

month = jul,

day = "1",

doi = "10.1017/S1431927600023151",

language = "English",

volume = "4",

pages = "606--607",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Photo-Electron Emission Microscopy of Semiconductor Surfaces

AU - Nemanich, R. J.

AU - English, S. L.

AU - Hartman, J. D.

AU - Yang, W.

AU - Ade, H.

AU - Davis, R. F.

PY - 1998/7/1

Y1 - 1998/7/1

UR - http://www.scopus.com/inward/record.url?scp=85180078919&partnerID=8YFLogxK

U2 - 10.1017/S1431927600023151

DO - 10.1017/S1431927600023151

M3 - Comment/debate

AN - SCOPUS:85180078919

SN - 1431-9276

VL - 4

SP - 606

EP - 607

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Photo-Electron Emission Microscopy of Semiconductor Surfaces

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