Photo-Electron Emission Microscopy of Semiconductor Surfaces

R. J. Nemanich; S. L. English; J. D. Hartman; W. Yang; H. Ade; R. F. Davis

doi:10.1017/S1431927600023151

Photo-Electron Emission Microscopy of Semiconductor Surfaces

R. J. Nemanich
, S. L. English
, J. D. Hartman
, W. Yang
, H. Ade
, R. F. Davis

Department of Physics

North Carolina State University

Research output: Contribution to journal › Comment/debate

1 Scopus citations

Original language	English
Pages (from-to)	606-607
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	4
DOIs	https://doi.org/10.1017/S1431927600023151
State	Published - 1 Jul 1998

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@article{d98441127472412ea0184358e23591dc,

title = "Photo-Electron Emission Microscopy of Semiconductor Surfaces",

author = "Nemanich, \{R. J.\} and English, \{S. L.\} and Hartman, \{J. D.\} and W. Yang and H. Ade and Davis, \{R. F.\}",

year = "1998",

month = jul,

day = "1",

doi = "10.1017/S1431927600023151",

language = "English",

volume = "4",

pages = "606--607",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Photo-Electron Emission Microscopy of Semiconductor Surfaces

AU - Nemanich, R. J.

AU - English, S. L.

AU - Hartman, J. D.

AU - Yang, W.

AU - Ade, H.

AU - Davis, R. F.

PY - 1998/7/1

Y1 - 1998/7/1

UR - https://www.scopus.com/pages/publications/85180078919

U2 - 10.1017/S1431927600023151

DO - 10.1017/S1431927600023151

M3 - Comment/debate

AN - SCOPUS:85180078919

SN - 1431-9276

VL - 4

SP - 606

EP - 607

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Photo-Electron Emission Microscopy of Semiconductor Surfaces

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