Photon energy dependence of contrast in photoelectron emission microscopy of Si devices
- V. W. Ballarotto
- , K. Siegrist
- , R. J. Phaneuf
- , E. D. Williams
- , W. C. Yang
- , R. J. Nemanich
- University of Maryland, College Park
- North Carolina State University
Research output: Contribution to journal › Article › peer-review
12
Scopus
citations