Physical insight into fractional power dependence of saturation current on gate voltage in advanced short channel MOSFETS (alpha-power law model)

Hyunsik Im, M. Song, T. Hiramoto, T. Sakurai

Research output: Contribution to conferencePaperpeer-review

24 Scopus citations

Abstract

The physical origin of the fractional power dependence of MOSFET drain current on gate voltage, namely α-power law model that has been considered as a fully empirical model, is analytically investigated. For this purpose, we have developed a new physics-based analytical drain current model. Using this model, we prove that the saturation current can be simplified in the form of B·(Vg-VTH)α, α-power law model. The physical interpretations on α, B, VTH are elucidated, and their analytical expressions are given in terms of MOSFET's parameters. Since the α-power model is compact and physics-based, it allows circuit designers to easily estimate the power dissipation and the gate delay time in a predictable manner.

Original languageEnglish
Pages13-18
Number of pages6
StatePublished - 2002
EventProceedings of the 2002 International Symposium on Low Power Electronics and Design - Monterey, CA, United States
Duration: 12 Aug 200214 Aug 2002

Conference

ConferenceProceedings of the 2002 International Symposium on Low Power Electronics and Design
Country/TerritoryUnited States
CityMonterey, CA
Period12/08/0214/08/02

Keywords

  • α-power model
  • MOSFET modeling
  • Saturation current

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