TY - JOUR
T1 - Praseodymium doped PbS thin films for optoelectronic applications prepared by nebulizer spray pyrolysis
AU - Paulraj, K.
AU - Ramaswamy, S.
AU - Yahia, I. S.
AU - Alshehri, A. M.
AU - Somaily, H. H.
AU - Kim, Hyun Seok
AU - Kathalingam, A.
N1 - Publisher Copyright:
© 2020, Springer-Verlag GmbH Germany, part of Springer Nature.
PY - 2020/7/1
Y1 - 2020/7/1
N2 - Abstract: Simple nebulizer spray technique used pristine and rare earth praseodymium (Pr) doped PbS thin films coated on soda-lime glass and their optoelectronic properties are reported. Dopant concentration-dependent structural, morphological, optical, and electrical properties of the prepared films were analyzed using X-ray diffraction, Raman spectrum, scanning electron microscopy, EDAX, UV–visible spectrum. X-ray diffraction study revealed the growth of polycrystalline face-centered cubic PbS thin films without any impurities. Increase of doping concentration resulted in a decrease in peak intensity indicating the degradation of crystalline quality. The Raman peaks observed at 190, 240 and 464 nm justified the formation of PbS phase. Surface morphology of the films showed dopant concentration dependent compact and uniform distribution of grains on substrate. EDAX studies legitimized the existence of Pb, S, and Pr in the prepared films. Energy band gap values of the films were gradually increased from 2.18 to 2.69 eV for the increase of doping concentration from 0 to 5 wt%. The prepared films exhibited increased currents for the increase of doping concentration with reasonable photosensing effect in I–V measurements. Graphic abstract: [Figure not available: see fulltext.].
AB - Abstract: Simple nebulizer spray technique used pristine and rare earth praseodymium (Pr) doped PbS thin films coated on soda-lime glass and their optoelectronic properties are reported. Dopant concentration-dependent structural, morphological, optical, and electrical properties of the prepared films were analyzed using X-ray diffraction, Raman spectrum, scanning electron microscopy, EDAX, UV–visible spectrum. X-ray diffraction study revealed the growth of polycrystalline face-centered cubic PbS thin films without any impurities. Increase of doping concentration resulted in a decrease in peak intensity indicating the degradation of crystalline quality. The Raman peaks observed at 190, 240 and 464 nm justified the formation of PbS phase. Surface morphology of the films showed dopant concentration dependent compact and uniform distribution of grains on substrate. EDAX studies legitimized the existence of Pb, S, and Pr in the prepared films. Energy band gap values of the films were gradually increased from 2.18 to 2.69 eV for the increase of doping concentration from 0 to 5 wt%. The prepared films exhibited increased currents for the increase of doping concentration with reasonable photosensing effect in I–V measurements. Graphic abstract: [Figure not available: see fulltext.].
KW - Current–voltage measurement
KW - nebulizer spray pyrolysis
KW - PbS thin films
KW - photosensitivity study
KW - Praseodymium doping
UR - http://www.scopus.com/inward/record.url?scp=85086249268&partnerID=8YFLogxK
U2 - 10.1007/s00339-020-03686-0
DO - 10.1007/s00339-020-03686-0
M3 - Article
AN - SCOPUS:85086249268
SN - 0947-8396
VL - 126
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 7
M1 - 503
ER -