Process control via gaze detection technology

Jaihie Kim; Gang Ryung Park; Steven LeClair

doi:10.1109/IPMM.1999.791556

Process control via gaze detection technology

Jaihie Kim
, Gang Ryung Park
, Steven LeClair

Department of Electronics & Electrical Engineering

Yonsei University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Original language	English
Title of host publication	Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
Editors	Marcello M. Veiga, John A. Meech, Michael H. Smith, Steven R. LeClair
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1263-1269
Number of pages	7
ISBN (Electronic)	0780354893, 9780780354890
DOIs	https://doi.org/10.1109/IPMM.1999.791556
State	Published - 1999
Event	2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 - Honolulu, United States Duration: 10 Jul 1999 → 15 Jul 1999

Publication series

Name	Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
Volume	2

Conference

Conference	2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999
Country/Territory	United States
City	Honolulu
Period	10/07/99 → 15/07/99

Access to Document

10.1109/IPMM.1999.791556

Cite this

Kim, J., Park, G. R., & LeClair, S. (1999). Process control via gaze detection technology. In M. M. Veiga, J. A. Meech, M. H. Smith, & S. R. LeClair (Eds.), Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 (pp. 1263-1269). Article 791556 (Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPMM.1999.791556

Kim, Jaihie ; Park, Gang Ryung ; LeClair, Steven. / Process control via gaze detection technology. Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. editor / Marcello M. Veiga ; John A. Meech ; Michael H. Smith ; Steven R. LeClair. Institute of Electrical and Electronics Engineers Inc., 1999. pp. 1263-1269 (Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999).

@inproceedings{9909cbe947f444a0bd20eae42f719421,

title = "Process control via gaze detection technology",

author = "Jaihie Kim and Park, \{Gang Ryung\} and Steven LeClair",

year = "1999",

doi = "10.1109/IPMM.1999.791556",

language = "English",

series = "Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1263--1269",

editor = "Veiga, \{Marcello M.\} and Meech, \{John A.\} and Smith, \{Michael H.\} and LeClair, \{Steven R.\}",

booktitle = "Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999",

address = "United States",

note = "2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999 ; Conference date: 10-07-1999 Through 15-07-1999",

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Kim, J, Park, GR & LeClair, S 1999, Process control via gaze detection technology. in MM Veiga, JA Meech, MH Smith & SR LeClair (eds), Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999., 791556, Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999, vol. 2, Institute of Electrical and Electronics Engineers Inc., pp. 1263-1269, 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999, Honolulu, United States, 10/07/99. https://doi.org/10.1109/IPMM.1999.791556

Process control via gaze detection technology. / Kim, Jaihie; Park, Gang Ryung; LeClair, Steven.
Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. ed. / Marcello M. Veiga; John A. Meech; Michael H. Smith; Steven R. LeClair. Institute of Electrical and Electronics Engineers Inc., 1999. p. 1263-1269 791556 (Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Process control via gaze detection technology

AU - Kim, Jaihie

AU - Park, Gang Ryung

AU - LeClair, Steven

PY - 1999

Y1 - 1999

UR - https://www.scopus.com/pages/publications/84957035424

U2 - 10.1109/IPMM.1999.791556

DO - 10.1109/IPMM.1999.791556

M3 - Conference contribution

AN - SCOPUS:84957035424

T3 - Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999

SP - 1263

EP - 1269

BT - Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999

A2 - Veiga, Marcello M.

A2 - Meech, John A.

A2 - Smith, Michael H.

A2 - LeClair, Steven R.

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999

Y2 - 10 July 1999 through 15 July 1999

ER -

Kim J, Park GR, LeClair S. Process control via gaze detection technology. In Veiga MM, Meech JA, Smith MH, LeClair SR, editors, Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999. Institute of Electrical and Electronics Engineers Inc. 1999. p. 1263-1269. 791556. (Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999). doi: 10.1109/IPMM.1999.791556

Process control via gaze detection technology

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