Quantitative analysis of defect states in amorphous InGaZnO thin-film transistors using photoinduced current transient spectroscopy

Hyunmin Hong, Kwang Sik Jeong, Jun Hyung Lim, Kyoung Seok Son, Kwun Bum Chung

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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