Quantitative analysis of defect states in amorphous InGaZnO thin-film transistors using photoinduced current transient spectroscopy

  • Hyunmin Hong
  • , Kwang Sik Jeong
  • , Jun Hyung Lim
  • , Kyoung Seok Son
  • , Kwun Bum Chung

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

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Material Science