Quantitative analysis of defect states in InGaZnO within 2 eV below the conduction band via photo-induced current transient spectroscopy
- Hyunmin Hong
- , Min Jung Kim
- , Dong Joon Yi
- , Yeon Keon Moon
- , Kyoung Seok Son
- , Jun Hyung Lim
- , Kwang Sik Jeong
- , Kwun Bum Chung
- Dongguk University
- Samsung
Research output: Contribution to journal › Article › peer-review
11
Scopus
citations