Recovery of Dry-Etch Damage in Gallium-Nitride Schottky Barrier Diodes

Bok Hyung Lee, Seong Dae Lee, Sam Dong Kim, In Seok Hwang, Hyun Chang Park, Hyung Moo Park, Jin Koo Rhee

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Fingerprint

Dive into the research topics of 'Recovery of Dry-Etch Damage in Gallium-Nitride Schottky Barrier Diodes'. Together they form a unique fingerprint.

Material Science

Engineering