@inproceedings{972bb870b2354869a95818944185086d,
title = "Reliability of ZrO2/GeOxNy stacked high-k dielectrics on Ge under dynamic and pulsed voltage stress",
abstract = "Charge trapping/detrapping in Al/ZrO2/GeOxN y/p-Ge MIS capacitors have been studied under dynamic voltage stresses of different amplitude and frequency in order to analyze the transient response and the degradation of the oxide as a function of the stress parameters. The current transients observed in dynamic voltage stresses have been interpreted in terms of the charging/discharging of interface and bulk traps. The evolution of the current during unipolar and bipolar voltage stresses shows the degradation being much faster at low frequencies than at high frequencies.",
author = "C. Mahata and Bera, {M. K.} and Bose, {P. K.} and A. Chakraborty and M. SenGupta and Maiti, {C. K.}",
year = "2008",
doi = "10.1109/IPFA.2008.4588188",
language = "English",
isbn = "1424420393",
series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",
booktitle = "2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",
note = "2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA ; Conference date: 07-07-2008 Through 11-07-2008",
}