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Revisiting Metal Sulfide Semiconductors: A Solution-Based General Protocol for Thin Film Formation, Hall Effect Measurement, and Application Prospects

  • Dipak V. Shinde
  • , Supriya A. Patil
  • , Keumnam Cho
  • , Do Young Ahn
  • , Nabeen K. Shrestha
  • , Rajaram S. Mane
  • , Joong Kee Lee
  • , Sung Hwan Han

Research output: Contribution to journalArticlepeer-review

78 Scopus citations

Abstract

Nanostructured thin films of metal sulfides (MS) are highly desirable materials for various optoelectronic device applications. However, a general low-temperature protocol that describes deposition of varieties of MS structures, especially in their film form is still not available in literatures. Here, a simple and highly effective general solution-based deposition protocol for highly crystalline and well-defined nanostructured MS thin films from ethanol on variety of conducting and non-conducting substrates is presented. The films display remarkable electronic properties such as high carrier mobility and high conductivity. When NiS thin film deposited on a flexible polyethylene terephthalate (PET) substrate is used as a fluorine doped tin oxide (FTO)-free counter electrode in dye-sensitized solar cells, it exhibits a solar-to-electric power conversion efficiency of 9.27 ± 0.26% with the highest conversion efficiency as high as 9.50% (vs 8.97 ± 0.07% exhibited by Pt-electrode). In addition, the NiS film deposited on a Ti-foil has demonstrated an outstanding catalytic activity for the hydrogen and oxygen evolution reactions from water.

Original languageEnglish
Pages (from-to)5739-5747
Number of pages9
JournalAdvanced Functional Materials
Volume25
Issue number36
DOIs
StatePublished - 1 Sep 2015

Keywords

  • general protocols
  • Hall effect
  • metal sulfides
  • Pt-free electrocatalysts
  • thin films

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