Role of insertion layer controlling wavelength in InGaAs quantum dots

  • Se Ki Park
  • , Young Ju Park
  • , Eun Kyu Kim
  • , Chan Jin Park
  • , Hoon Young Cho
  • , Young Soo Lim
  • , Jeong Yong Lee
  • , Cheon Lee

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We have observed the red shift of the emission wavelength in InGaAs/GaAs quantum dots by employing a very thin AlGaAs insertion layer (IL). The thin AlGaAs layer of less than 10 nm in thickness was inserted immediately after the formation of selfassembled InGaAs quantum dots (QDs) on a GaAs buffer layer. The low temperature (15 K) photoluminescence peak typically appears at around 1.1 μm in the sample without IL whereas it is red-shifted up to 1.25 μm as the IL thickness increases. It is interpreted that the thin AlGaAs IL releases the local strain around QDs asymmetrically.

Original languageEnglish
Pages (from-to)4378-4381
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume41
Issue number6 B
DOIs
StatePublished - Jun 2002

Keywords

  • AIGaAs insertion layer (IL)
  • InGaAs/GaAs quantum dots
  • Local strain
  • Metal organic chemical vapor deposition
  • Red-shift

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