Abstract
Hexagonal AlxGa1-xN nanorods were grown by plasma-assisted molecular beam epitaxy (PAMBE) on Si(001) substrates. The Al mole fraction was determined from x-ray diffraction (XRD) measurement and its value was varied from 0 to 15. It is found that, under group III-rich conditions, the growth rate of the AlxGa1-xN nanorods decreases and the diameter increases due to the possibility of incorporation of aluminium and gallium. In order to study structural and optical properties, x-ray diffraction and cathodoluminescence (CL) measurements were carried out. The Al content (x) is calculated from these measurements and their values are compared.
Original language | English |
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Article number | 018 |
Pages (from-to) | 4640-4643 |
Number of pages | 4 |
Journal | Nanotechnology |
Volume | 17 |
Issue number | 18 |
DOIs | |
State | Published - 28 Sep 2006 |