SENSE factors for reliable cortical thickness measurement
- Hae Jeong Park
- , Tak Youn
- , Seok Oh Jeong
- , Maeng Keun Oh
- , Sei Young Kim
- , Eung Yeop Kim
- Yonsei University
- Hankuk University of Foreign Studies
Research output: Contribution to journal › Article › peer-review
10
Scopus
citations