Shape stability of TiSi2 islands on Si (111)

W. C. Yang; H. Ade; R. J. Nemanich

doi:10.1063/1.1636526

Shape stability of TiSi₂ islands on Si (111)

W. C. Yang, H. Ade, R. J. Nemanich

Department of Physics

North Carolina State University

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

Photoelectron emission microscopy (PEEM), which has the capability of hih-temperature in situ growth an real time imaging, is employed to observe the dynamics of shape transitions of TiSi₂ islands on Si(111) surfaces. In particular, the elongation of initially nearly circular islands into wire structures an dimensional variation of the evolving islands is observed. As such, different cross-sectional shapes of the elongated islands are found.

Original language	English
Pages (from-to)	1572-1576
Number of pages	5
Journal	Journal of Applied Physics
Volume	95
Issue number	3
DOIs	https://doi.org/10.1063/1.1636526
State	Published - 1 Feb 2004

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title = "Shape stability of TiSi2 islands on Si (111)",

abstract = "Photoelectron emission microscopy (PEEM), which has the capability of hih-temperature in situ growth an real time imaging, is employed to observe the dynamics of shape transitions of TiSi2 islands on Si(111) surfaces. In particular, the elongation of initially nearly circular islands into wire structures an dimensional variation of the evolving islands is observed. As such, different cross-sectional shapes of the elongated islands are found.",

author = "Yang, {W. C.} and H. Ade and Nemanich, {R. J.}",

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AU - Ade, H.

AU - Nemanich, R. J.

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N2 - Photoelectron emission microscopy (PEEM), which has the capability of hih-temperature in situ growth an real time imaging, is employed to observe the dynamics of shape transitions of TiSi2 islands on Si(111) surfaces. In particular, the elongation of initially nearly circular islands into wire structures an dimensional variation of the evolving islands is observed. As such, different cross-sectional shapes of the elongated islands are found.

AB - Photoelectron emission microscopy (PEEM), which has the capability of hih-temperature in situ growth an real time imaging, is employed to observe the dynamics of shape transitions of TiSi2 islands on Si(111) surfaces. In particular, the elongation of initially nearly circular islands into wire structures an dimensional variation of the evolving islands is observed. As such, different cross-sectional shapes of the elongated islands are found.

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 3

ER -

Shape stability of TiSi₂ islands on Si (111)

Abstract

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