Stress-induced degradation in strain-engineered nMOSFETs

T. K. Maiti, S. S. Mahato, M. K. Bera, M. Sengupta, P. Chakraborty, C. Mahata, A. Chakraborty, C. K. Maiti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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