Stress-induced degradation in strain-engineered nMOSFETs
- T. K. Maiti
- , S. S. Mahato
- , M. K. Bera
- , M. Sengupta
- , P. Chakraborty
- , C. Mahata
- , A. Chakraborty
- , C. K. Maiti
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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