Abstract
Zn 1-xMn xO thin films were grown on Al 2O 3 (0001) substrates by an r.f. magnetron sputtering method. The films grown without buffer layer showed the columnar-structured configuration. In contrast, the films grown by employing a 40-nm-thick buffer layer showed a significantly clean surface with mirror-like morphology. From the results of photoluminescence measurements at room temperature, UV emission originating from near-band-edge emission was observed for the mirror-like Zn 0.93Mn 0.07O thin films, while the columnar-structured Zn 0.93Mn 0.07O thin films were optically poor. The mirror-like Zn 0.93Mn 0.07O thin films clearly showed a hysteretic behavior for the measurement of magnetization, which is obvious evidence of ferromagnetism. The columnar-structured Zn 0.93Mn 0.07O thin films revealed a step-like curve around 20 ∼ 50 K in the characteristic of temperature-dependent magnetization, which might be attributed to the solid solution of Mn 3O 4 observed in X-ray diffraction patterns.
Original language | English |
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Pages (from-to) | 1304-1307 |
Number of pages | 4 |
Journal | Journal of the Korean Physical Society |
Volume | 45 |
Issue number | 5 II |
State | Published - Nov 2004 |
Keywords
- Diluted magnetic semiconductor
- Ferromagnetism
- Magnetron sputtering
- ZnMnO