Switching from classical to ballistic transport in a 100-nm Γ-gate AlGaAs/InGaAs pseudomorphic HEMT at low temperatures

Nambin Kim, Yongmin Kim, Woong Jung, Hyunsik Im, Hyungsang Kim, Sungchan Kim, Donghoon Shin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have investigated the temperature dependence of the drain current in a 100 nm-gate AlGaAs/InGaAs pseudomorphic HEMT (pHEMT). It is clearly demonstrated that the ballistic component in the drain current characteristics is enhanced by both lowering temperature and increasing drain voltage. Modeled results for the transmission coefficient (t) confirm our analysis of the experimental observation.

Original languageEnglish
Title of host publicationPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
Pages597-598
Number of pages2
DOIs
StatePublished - 2007
Event28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Austria
Duration: 24 Jul 200628 Jul 2006

Publication series

NameAIP Conference Proceedings
Volume893
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference28th International Conference on the Physics of Semiconductors, ICPS 2006
Country/TerritoryAustria
CityVienna
Period24/07/0628/07/06

Keywords

  • Backscattering
  • Ballistic transport
  • Pseudomorphic high-electron-mobility transistor (pHEMT)

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