Abstract
The temperature-dependent nucleation and growth mechanism of electrodeposited zinc oxide (ZnO) thin films on fluorine-doped tin-oxide-coated (10-20 Ω cm-2) glass substrates from an acetate solution was studied by using the chronoamperometry technique. The morphological, compositional and structural properties were studied by scanning electron microscopy (SEM), x-ray photoelectron spectroscopy (XPS) and x-ray diffraction techniques. The current transients were analyzed by fitting chronoamperometric data into the Scharifker-Hills nucleation model, which reveals a change in the nucleation and growth mechanism from progressive to intermediate (progressive + instantaneous) to instantaneous with a rise in bath temperature (from 25°C to 75°C). The SEM study showed hexagonal grains for the films obtained at 35°C. The x-ray diffraction spectra revealed the formation of phase-pure ZnO thin films. The chemical state of the deposit was confirmed by XPS measurements.
Original language | English |
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Pages (from-to) | 85013 |
Number of pages | 1 |
Journal | Semiconductor Science and Technology |
Volume | 23 |
Issue number | 8 |
DOIs | |
State | Published - 1 Aug 2008 |