The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature- illumination stress
- Ji Sim Jung
- , Kyoung Seok Son
- , Kwang Hee Lee
- , Joon Seok Park
- , Tae Sang Kim
- , Jang Yeon Kwon
- , Kwun Bum Chung
- , Jin Seong Park
- , Bonwon Koo
- , Sangyun Lee
- Samsung
- Dankook University
Research output: Contribution to journal › Article › peer-review
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