The origin of traps and the effect of nitrogen plasma in oxide-nitride-oxide structures for non-volatile memories

  • W. S. Kim
  • , D. W. Kwak
  • , J. S. Oh
  • , D. W. Lee
  • , H. Y. Cho

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'The origin of traps and the effect of nitrogen plasma in oxide-nitride-oxide structures for non-volatile memories'. Together they form a unique fingerprint.
Sort by

Material Science