Ti/Cu bilayer electrodes for SiNx -passivated Hf-In-Zn-O thin film transistors: Device performance and contact resistance

Joon Seok Park, Tae Sang Kim, Kyoung Seok Son, Eunha Lee, Ji Sim Jung, Kwang Hee Lee, Wan Joo Maeng, Hyun Suk Kim, Eok Su Kim, Kyung Bae Park, Jang Yeon Kwon, Myung Kwan Ryu, Sang Yoon Lee

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