Skip to main navigation Skip to search Skip to main content

Ultra-thin dielectric breakdown in devices and circuits: A brief review

  • Purdue University

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Fingerprint

Dive into the research topics of 'Ultra-thin dielectric breakdown in devices and circuits: A brief review'. Together they form a unique fingerprint.
Sort by

Material Science

Engineering