Unusual energy storage and charge retention in Co-based metal-organic-frameworks

Deok Yeon Lee; Seog Joon Yoon; Nabeen K. Shrestha; Soo Hyoung Lee; Heejoon Ahn; Sung Hwan Han

doi:10.1016/j.micromeso.2011.12.040

Unusual energy storage and charge retention in Co-based metal-organic-frameworks

Deok Yeon Lee
, Seog Joon Yoon
, Nabeen K. Shrestha
, Soo Hyoung Lee
, Heejoon Ahn
, Sung Hwan Han

Division of System Semiconductor

Research output: Contribution to journal › Article › peer-review

409 Scopus citations

Abstract

In this communication, we explore the cobalt based metal-organic-frameworks (Co-MOF) as a promising material for supercapacitors. The doctor bladed Co-MOF film exhibits a good pseudocapacitor behavior with the specific capacitance up to 206.76 F g ^-1. The electrochemical redox switching is reversible perfectly for a long run which leads to the loss of only 1.5% in capacitance for 1000 electrochemical life cycle stability test.

Original language	English
Pages (from-to)	163-165
Number of pages	3
Journal	Microporous and Mesoporous Materials
Volume	153
DOIs	https://doi.org/10.1016/j.micromeso.2011.12.040
State	Published - 1 May 2012

Keywords

Charge retention
Cobalt
Energy storage
Metal-organic-frameworks
Supercapacitor

Access to Document

10.1016/j.micromeso.2011.12.040

Cite this

@article{605804f4e4f4432a8b45dcbf2324dc76,

title = "Unusual energy storage and charge retention in Co-based metal-organic-frameworks",

abstract = "In this communication, we explore the cobalt based metal-organic-frameworks (Co-MOF) as a promising material for supercapacitors. The doctor bladed Co-MOF film exhibits a good pseudocapacitor behavior with the specific capacitance up to 206.76 F g -1. The electrochemical redox switching is reversible perfectly for a long run which leads to the loss of only 1.5\% in capacitance for 1000 electrochemical life cycle stability test.",

keywords = "Charge retention, Cobalt, Energy storage, Metal-organic-frameworks, Supercapacitor",

author = "Lee, \{Deok Yeon\} and Yoon, \{Seog Joon\} and Shrestha, \{Nabeen K.\} and Lee, \{Soo Hyoung\} and Heejoon Ahn and Han, \{Sung Hwan\}",

year = "2012",

month = may,

day = "1",

doi = "10.1016/j.micromeso.2011.12.040",

language = "English",

volume = "153",

pages = "163--165",

journal = "Microporous and Mesoporous Materials",

issn = "1387-1811",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Unusual energy storage and charge retention in Co-based metal-organic-frameworks

AU - Lee, Deok Yeon

AU - Yoon, Seog Joon

AU - Shrestha, Nabeen K.

AU - Lee, Soo Hyoung

AU - Ahn, Heejoon

AU - Han, Sung Hwan

PY - 2012/5/1

Y1 - 2012/5/1

N2 - In this communication, we explore the cobalt based metal-organic-frameworks (Co-MOF) as a promising material for supercapacitors. The doctor bladed Co-MOF film exhibits a good pseudocapacitor behavior with the specific capacitance up to 206.76 F g -1. The electrochemical redox switching is reversible perfectly for a long run which leads to the loss of only 1.5% in capacitance for 1000 electrochemical life cycle stability test.

AB - In this communication, we explore the cobalt based metal-organic-frameworks (Co-MOF) as a promising material for supercapacitors. The doctor bladed Co-MOF film exhibits a good pseudocapacitor behavior with the specific capacitance up to 206.76 F g -1. The electrochemical redox switching is reversible perfectly for a long run which leads to the loss of only 1.5% in capacitance for 1000 electrochemical life cycle stability test.

KW - Charge retention

KW - Cobalt

KW - Energy storage

KW - Metal-organic-frameworks

KW - Supercapacitor

UR - https://www.scopus.com/pages/publications/84863117559

U2 - 10.1016/j.micromeso.2011.12.040

DO - 10.1016/j.micromeso.2011.12.040

M3 - Article

AN - SCOPUS:84863117559

SN - 1387-1811

VL - 153

SP - 163

EP - 165

JO - Microporous and Mesoporous Materials

JF - Microporous and Mesoporous Materials

ER -

Unusual energy storage and charge retention in Co-based metal-organic-frameworks

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this