Wafer-Scale, Thickness-Controlled p-CuInSe2/n-Si Heterojunction for Self-Biased, Highly Sensitive, and Broadband Photodetectors
- Vishwa Bhatt
- , Manjeet Kumar
- , Eun Chong Kim
- , Hak Jun Chung
- , Ju Hyung Yun
- Incheon National University
- Korea Electronics Technology Institute
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations