Worst case sampling method with confidence ellipse for estimating the impact of random variation on static random access memory (SRAM)
- Sangheon Oh
- , Jaesung Jo
- , Hyunjae Lee
- , Gyo Sub Lee
- , Jung Dong Park
- , Changhwan Shin
- University of Seoul
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations