XX-XY interface band mixing in GaAs/AlAs heterostructures

Hyunsik Im, L. E. Bremme, Y. C. Chung, P. C. Klipstein, R. Grey, G. Hill

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations

Abstract

The in-plane dispersion of the XX,Y states in a GaAs/AlAs `double-barrier structure' is measured by varying the angle of an in-plane magnetic field. When XX,Y (1) states in the emitter AlAs layer tunnel into collector XX,Y (m>1) states, a characteristic dumbbell shape is observed for the bias shift of the resonant tunneling peak versus magnetic field angle, with the major axis along [1 1 0] or [1̄ 1 0]. This corresponds to an elliptical constant energy surface in the collector AlAs layer which is rotated by 45° with respect to the bulk Fermi surface. We explain the new symmetry by XY-XY interface band mixing which is closely analogous to the widely studied Γ-XZ mixing. Our results provide new insight into the microscopic origin of both types of mixing.

Original languageEnglish
Pages (from-to)214-217
Number of pages4
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume6
Issue number1
DOIs
StatePublished - Feb 2000
Event13th International Conference on the Electronic Properties of Two-Dimensional Systems (EP2DS-13) - Ottawa, Ont, Can
Duration: 1 Aug 19996 Aug 1999

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